MEHDI H., REVERET F., ROBERT-GOUMET C., BIDEUX L., GRUZZA B., HOGGAN P., LEYMARIE J., ANDRE Y., GIL E., PELISSIER B., LEVERT T., PAGET D., MONIER G.
Investigation of n2 plasma gaas surface passivation efficiency against air exposure: towards an enhanced diode
applied surface science, vol. 579, p. 152191
2022 apr


NACEUR S., CHOUBANI M., SMIRI B., MAAREF H., MONIER G., ROBERT-GOUMET C., SFAXI L., GRUZZA B., MGHAIETH R.
The effect of nitridation on the optical properties of inas quantum dots grown on gaas substrate by mbe
vacuum, vol. 172, p. 109097
2020


MEHDI H., REVERET F., BOUGEROL C., ROBERT-GOUMET C., HOGGAN P., BIDEUX L., GRUZZA B., LEYMARIE J., MONIER G.
Study of GaN layer crystallization on GaAs(100) using electron cyclotron resonance or glow discharge N2 plasma sources for the nitriding process
Applied Surface Science, vol. 495, p. 143586
2019


ROBERT-GOUMET C., AYMEN MAHJOUB M., MONIER G., BIDEUX L., GRUZZA B.
Multi-mode elastic peak electron microscopy (MM-EPEM): a new imaging technique with an ultimate in-depth resolution for surface analysis
Ultramicroscopy, vol. 188, p. 13--18
2018 may


RABEHI A., AMRANI M., BENAMARA Z., AKKAL B., ZIANE A., GUERMOUI M., HATEM-KACHA A., MONIER G., GRUZZA B., BIDEUX L., ROBERT-GOUMET C.
Simulation and experimental studies of illumination effects on the current transport of nitridated gaas schottky diode
semiconductors, vol. 52, p. 1998--2006
2018


MONIER G., BIDEUX L., GRUZZA B., HOGGAN P., MEHDI H., HIJAZI H., ROBERT-GOUMET C.
Global study of self-limited plasma nitridation process for GaAs(100) surface passivation
7th International Conference NANOSEA NANO-structures and nanomaterials SELf-Assembly
2018


GRUZZA B.
Modélisation de signaux XPS et cinétique de la passivation par une couche mince de GaN élaborée sur GaAs(100) par voie plasma N2
8ème conférence francophone sur les spectroscopies d’électrons (ELSPEC 2018), Biarritz, Juin 2018
2018


MEHDI H., MONIER G., BIDEUX L., GRUZZA B., ROBERT GOUMET C., MAHJOUB A., PELISSIER B.
N2 plama passivation of GaAs(100) and air exposure study of GaN/GaAs structures by XPS, LEED, p-ARXPS and PL measurements
8ème conférence francophone sur les spectroscopies d’électrons (ELSPEC 2018), Biarritz, Juin 2018
2018


MEHDI H., ROBERT GOUMET C., MONIER G., BIDEUX L., GRUZZA B.
Combined XPS model and growth kinetic model of passivating GaN thin film elaborated on GaAs
Journées des Spectroscopies Electroniques JSE2017, Juin 2017, Paris
2017


MAHJOUB M., MONIER G., ROBERT-GOUMET C., REVERET F., ECHABAANE M., CHAUDANSON D., PETIT M., BIDEUX L., GRUZZA B.
Synthesis and study of stable and size-controlled zno-sio2 quantum dots: application as a humidity sensor
journal of physical chemistry c, vol. 120, p. 11652--11662
2016 may


KACHA A., AKKAL B., BENAMARA Z., ROBERT-GOUMET C., MONIER G., GRUZZA B.
Study of the surface state density and potential in mis diode schottky using the surface photovoltage method
Molecular crystals and liquid crystals, vol. 627, p. 66--73
2016


MONIER G., MAHJOUB A., ROBERT-GOUMET C., BIDEUX L., GRUZZA B.
Nouvelle méthode de détermination de la fonction de correction d’un analyseur d’électron : Application aux études quantitatives par spectroscopies d’électrons : méthode combinée XPS + MM-EPES
ELSPEC 2016 Conférence francophone sur les spectroscopies d'électrons
2016


MAHJOUB A., ROBERT GOUMET C., MONIER G., BIDEUX L., GRUZZA B.
Determination of gold quantity deposited on silicon substrates by elastic electron measurements associated with Monte Carlo simulations and XPS measurements
ECASIA'15, 16th European Conference on Applications of Surface and Interface Analysis, Grenada, 28 sept.-1 oct, Espagne
2016


ROBERT GOUMET C., MAHJOUB A., MONER G., BIDEUX L., GRUZZA B.
MM-EPES : Non destructive method for thin films analysis. Applications to Si nanoporous surfaces and Au deposits on SiO2/Si
ECASIA'15, 16th European Conference on Applications of Surface and Interface Analysis, Grenada, 28 sept.-1 oct, Espagne
2016


MAHJOUB A., MONIER G., ROBERT GOUMET C., BIDEUX L., GRUZZA B.
XPS and MM-EPES techniques combined for the study of ultra thin films: Application to gold deposition on SiO2/Si structures
JSPS International Workshop Core-to-Core Program Atomically Controlled Processing for Ultra-large Scale Integration Marseille - France, July 9-10, 2015 :
2016


KACHA A., AKKAL A., BENAMARA Z., AMRANI M., MONIER G., ROBERT-GOUMET C., BIDEUX L., GRUZZA B.
Effects of the GaN layers and the annealing on the electrical properties in the Schottky diodes based on nitrated GaAs
Superlattices and Microstructures, vol. 83, p. 827--833
2015


RABEHI M., AMRANI Z., BENAMARA Z., AKKAL A., KACHA A., ROBERT-GOUMET C., MONIER G., GRUZZA B.
Study of the characteristics current-voltage and capacitance-voltage in nitride GaAs Schottky diode
The European Physical Journal – Applied Physics, vol. 72, p. 10102--10106
2015


MAHJOUB M., MONIER G., ROBERT-GOUMET C., BIDEUX L., GRUZZA B.
XPS combined with MM-EPES technique for in situ study of ultra thin film deposition: Application to an Au/SiO2/Si structure
Applied Surface Science, vol. 357, p. 1268--1273
2015


MONIER G., PAULY N., ROBERT-GOUMET C., MAHJOUB A., BIDEUX L., GRUZZA B., TOUGAARD S.
Influence of surface core hole effects for quantitative X-ray photoelectron spectroscopy by peak shape analysis
ECASIA'15 European Conference on Applications of Surface and Interface Analysis
2015


KACHA A., AKKAL B., BENAMARA Z., ROBERT GOUMET C., MONIER G., GRUZZA B.
Study of the surface state density and potential in MIS diode Schottky using the surface photovoltage method
13th International Conference on Frontiers of Polymers and Advanced Materials (ICFPAM) 29 March-2 April 2015, Marrakesh, Maroc
2015


PAULY N., DUBUS A., MONIER G., MAHJOUB M., BIDEUX L., GRUZZA B.
Energy dependence of the energy loss function parametrization of indium in the Drude-Lindhard model
Surface and Interface Analysis, vol. 46, p. 283--288
2014


PAULY N., DUBUS A., MONIER G., ROBERT-GOUMET C., MAHJOUB M., BIDEUX L., GRUZZA B.
Energy dependence of the energy loss function parametrization of indium in the drude-lindhard model
surface and interface analysis, vol. 46, p. 283--288
2014


MAHJOUB M., MONIER G., ROBERT-GOUMET C., BIDEUX L., GRUZZA B.
New method for the determination of the correction function of a hemisperical electron analyser based on elastic electron images
Journal of Electron Spectroscopy and Related Phenomena, vol. 197, p. 80--87
2014


ROBERT-GOUMET C., MAHJOUB M., MONIER G., BIDEUX L., CHELDA S., DUPUIS R., PETIT M., HOGGAN P., GRUZZA B.
Development of monte-carlo simulations for nano-patterning surfaces associated with mm-epes analysis: application to different si(111) nanoporous surfaces
surface science, vol. 618, p. 72--77
2013


TALBI A., BENAMARA M., TALBI M., BENAMARA Z., AKKAL B., GRUZZA B., ROBERT-GOUMET C., BIDEUX L., MONIER G.
Study of inp(100)nitridation using aes spectroscopy and electrical analysis: effect of annealing after nitridation
journal of optoelectronics and advanced materials, vol. 15, p. 509--513
2013


MONIER G., BIDEUX L., ROBERT-GOUMET C., GRUZZA B., ANDRE Y., AVIT J., PETIT M., MENYHARD M., PAGET D., KUBSKY S.
High quality c-GaN ultra-thin film growth on GaAs (001): Passivating effect and initiation of cubic-GaN bulk structure growth
ECASIA'13 European Conference on Applications of Surface and Interface Analysis
2013


MONIER G., BIDEUX L., ROBERT-GOUMET C., GRUZZA B., PETIT M., LABAR J., MENYHARD M.
Passivation of gaas(001) surface by the growth of high quality c-gan ultra-thin film using low power glow discharge nitrogen plasma source
surface science, vol. 606, p. 1093--1099
2012


AMEUR K., MAZARI H., TIZI S., KHELIFI R., BENAMARA Z., BENSEDDIK N., CHAIB A., ZOUGAGH N., MOSTEFAOUI M., BIDEUX L., MONIER G., GRUZZA B., ROBERT-GOUMET C.
Study of the characteristics current-voltage and capacity-voltage of hg/gan/gaas structures
sensor letters, vol. 9, p. 2268--2271
2011


MONIER G., BIDEUX L., ROBERT-GOUMET C., GRUZZA B.
Study of high quality GaN epilayers formation on GaAs(001) using low power GDS nitrogen plasma source
ICFSI 13 International Conference on the formation of semiconductor Interfaces
2011


GRUZZA B., CHELDA S., ROBERT-GOUMET C., BIDEUX L., MONIER G.
Monte carlo simulation for multi-mode elastic peak electron spectroscopy of crystalline materials: effects of surface structure and excitation
surface science, vol. 604, p. 217--226
2010


FLORI M., GRUZZA B., BIDEUX L., MONIER G., ROBERT-GOUMET C., KRAWCZYK M.
Surface analysis of a plasma-nitrided structural steel
metalurgia international, vol. 15, p. 5--9
2010


BENAMARA Z., MECIRDI N., AKKAL B., MAZARI H., CHELLALI M., TALBI A., GRUZZA B., BEN KHALIFA S., ROBERT-GOUMET C., MONIER G., BIDEUX L.
Electrical characterization and electronic transport modelization in the inn/lnp structures
sensor letters, vol. 7, p. 712--715
2009


FLORI M., GRUZZA B., BIDEUX L., MONIER G., ROBERT-GOUMET C., BENAMARA Z.
First stages of surface steel nitriding: x-ray photoelectron spectroscopy and electrical measurements
applied surface science, vol. 255, p. 9206--9210
2009


ROBERT-GOUMET C., MONIER G., ZEFACK B., CHELDA S., BIDEUX L., GRUZZA B., AWITOR O.
Sem and xps studies of nanohole arrays on inp(1 0 0) surfaces created by coupling aao templates and low energy ar+ ion sputtering
surface science, vol. 603, p. 2923--2927
2009


MONIER G., BIDEUX L., DESPLATS O., FONTAINE C., ROBERT-GOUMET C., GRUZZA B.
Xps study of the o <inf>2</inf> /sf <inf>6</inf> microwave plasma oxidation of (0 0 1) gaas surfaces
applied surface science, vol. 256, p. 56--60
2009


MONIER G., BIDEUX L., DESPLATS O., FONTAINE C., ROBERT-GOUMET C., GRUZZA B.
XPS study of the O2/SF6 micro-wave plasma oxidation of (001)GaAs surfaces
ECOSS 26 26th European Conference on Surface Science
2009


FLORI M., GRUZZA B., BIDEUX L., MONIER G., ROBERT-GOUMET C.
A study of the 42crmo4 steel surface by quantitative xps electron spectroscopy
applied surface science, vol. 254, p. 4738--4743
2008


CHELDA S., ROBERT-GOUMET C., GRUZZA B., BIDEUX L., MONIER G.
Effect of surface roughness on epes and arepes measurements: flat and crenels silicon surfaces
surface science, vol. 602, p. 2114--2120
2008


BIDEUX L., MONIER G., MATOLIN V., ROBERT-GOUMET C., GRUZZA B.
Xps study of the formation of ultrathin gan film on gaas(1 0 0)
applied surface science, vol. 254, p. 4150--4153
2008


FLORI M., GRUZZA B., BIDEUX L., MONIER G., ROBERT-GOUMET C., CHERRE J., DE BAYNAST H.
Xps, epma and microstructural analysis of a defective industrial plasma-nitrided steel
surface and coatings technology, vol. 202, p. 5887--5894
2008


ROBERT-GOUMET C., PETIT M., BIDEUX L., GRUZZA B., MONIER G., MATOLIN V., SKALA T., TSUD N., PRINCE K.
Combined eels, leed and sr-xps study of ultra-thin crystalline layers of indium nitride on inp(1 0 0)-effect of annealing at 450 °c
applied surface science, vol. 253, p. 4445--4449
2007


BEN KHALIFA S., GRUZZA B., ROBERT-GOUMET C., BIDEUX L., MONIER G., SAIDI F., M'GHAIETH R., HJIRI M., HAMILA R., HASSEN F., MAAREF H., BREMOND G., BEJI L.
Study of porous iii-v semiconductors by electron spectroscopies (aes and xps) and optical spectroscopy (pl): effect of ionic bombardment and nitridation process
surface science, vol. 601, p. 4531--4535
2007


BIDEUX L., ROBERT C., MERLE S., GRUZZA B., GOUMET E., GIL E.
Some applications of elastic peak electron spectroscopy for semiconductor surface studies
surface and interface analysis, vol. 26, p. 903--907
1998


MIHAILOVIC M., BANVILLET H., GRUZZA B., GIL E., CADORET R.
Transient stages during epitaxy of heterostructures on inp in a hvpe reactor. application to inp/inas/inp multiquantum wells growth
trans. tech. publications, vol. 36, p. 480--488
1991