BEJI H., DEVELAY V., MONIER G., BIDEUX L., HOGGAN P., BOUSQUET A., TOMASELLA E., ROBERT-GOUMET C.
Angle-resolved X-ray photoelectron spectroscopy intensity modeling of SiNx ultrathin layer grown on Si (100) and Si (111) substrates by N2 plasma treatment
Thin Solid Films, vol. 798, p. 140388
2024


TSAMO G., NASTOVJAK A., SHWARTZ N., HOGGAN P., ROBERT-GOUMET C., PIMPINELLI A., PETIT M., RANGUIS A., GARDES E., SALL M., BIDEUX L., MONIER G.
Growth mechanisms of GaN/GaAs nanostructures by droplet epitaxy explained by complementary experiments and simulations
journal of physical chemistry c, vol. 128, p. 5168--5178
2024 mar


MEHDI H., REVERET F., ROBERT-GOUMET C., BIDEUX L., GRUZZA B., HOGGAN P., LEYMARIE J., ANDRE Y., GIL E., PELISSIER B., LEVERT T., PAGET D., MONIER G.
Investigation of n2 plasma gaas surface passivation efficiency against air exposure: towards an enhanced diode
applied surface science, vol. 579, p. 152191
2022 apr


TSAMO G., MONIER G., HOGGAN P., ROBERT-GOUMET C., PETIT M., RANGUIS A., BIDEUX L.
XPS modeling of GaN/GaAs nanostructure grown by the droplet epitaxy technique
Journal of Electron Spectroscopy and Related Phenomena, vol. 261, p. 147257
2022 07


BEJI H., MONIER G., BIDEUX L., BOUSQUET A., TOMASELLA E., ROBERT GOUMET C.
AR-XPS intensities modelisation of SiNx ultrathin layers on Si (100) created by N2 plasma treatment
JNSPE 2022 (Journées Nationales des Spectroscopies de PhotoEmission)
2022


TSAMO G., BIDEUX L., MONIER G., HOGGAN P., ROBERT GOUMET C.
Growth of GaN nanostructures on GaAs(111)A substrate by Droplet Epitaxy : A theoretical and experimental characterization by XPS spectroscopy
JNSPE 2022 (Journées Nationales des Spectroscopies de PhotoEmission)
2022


BEJI H., DEVELAY V., MONIER G., BIDEUX L., HOGGAN P., BOUSQUET A., TOMASELLA E., ROBERT-GOUMET C.
Optimization of the anti-reflective coating (SiCxNyH) / Silicon interface by the nitridation process to improve silicon photovoltaic cell performance
PLATHINIUM 2021
2021


ANDRE Y., ISIK GOKTAS N., MONIER G., HIJAZI H., MEHDI H., BOUGEROL C., BIDEUX L., TRASSOUDAINE A., PAGET D., LEYMARIE J., GIL E., ROBERT-GOUMET C., LAPIERRE R.
Optical and structural analysis of ultra-long GaAs nanowires after nitrogen-plasma passivation
Nano Express, vol. 1, p. 020019
2020 sep 04


MONIER G., HOGGAN P., BIDEUX L., PAGET D., MEHDI H., KUBSKY S., DUMAS P., ROBERT-GOUMET C.
DFT and experimental FTIR investigations of early stages of (001) and (111)B GaAs surface nitridation
Applied Surface Science, vol. 465, p. 787--794
2019


MEHDI H., REVERET F., BOUGEROL C., ROBERT-GOUMET C., HOGGAN P., BIDEUX L., GRUZZA B., LEYMARIE J., MONIER G.
Study of GaN layer crystallization on GaAs(100) using electron cyclotron resonance or glow discharge N2 plasma sources for the nitriding process
Applied Surface Science, vol. 495, p. 143586
2019


ROBERT GOUMET C., MONIER G., MEHDI H., HOGGAN P., BIDEUX L., REVERET F., LEYMARIE J., MAHJOUB A., PELISSIER B.
Toward optimum N2 plasma nitriding process for GaAs(100) surface passivation
Journées Surfaces et Interfaces - JSI Nancy, Janvier 2019
2019


ROBERT-GOUMET C., MEHDI H., MONIER G., HOGGAN P., BIDEUX L., DUBROVSKII V.
Combined angle-resolved x-ray photoelectron spectroscopy, density functional theory and kinetic study of nitridation of gallium arsenide
applied surface science, vol. 427, p. 662--669
2018 jan


ROBERT-GOUMET C., AYMEN MAHJOUB M., MONIER G., BIDEUX L., GRUZZA B.
Multi-mode elastic peak electron microscopy (MM-EPEM): a new imaging technique with an ultimate in-depth resolution for surface analysis
Ultramicroscopy, vol. 188, p. 13--18
2018 may


RABEHI A., AMRANI M., BENAMARA Z., AKKAL B., ZIANE A., GUERMOUI M., HATEM-KACHA A., MONIER G., GRUZZA B., BIDEUX L., ROBERT-GOUMET C.
Simulation and experimental studies of illumination effects on the current transport of nitridated gaas schottky diode
semiconductors, vol. 52, p. 1998--2006
2018


MONIER G., BIDEUX L., GRUZZA B., HOGGAN P., MEHDI H., HIJAZI H., ROBERT-GOUMET C.
Global study of self-limited plasma nitridation process for GaAs(100) surface passivation
7th International Conference NANOSEA NANO-structures and nanomaterials SELf-Assembly
2018


MEHDI H., MONIER G., BIDEUX L., GRUZZA B., ROBERT GOUMET C., MAHJOUB A., PELISSIER B.
N2 plama passivation of GaAs(100) and air exposure study of GaN/GaAs structures by XPS, LEED, p-ARXPS and PL measurements
8ème conférence francophone sur les spectroscopies d’électrons (ELSPEC 2018), Biarritz, Juin 2018
2018


MEHDI H., MONIER G., ROBERT GOUMET C., HOGGAN P., BIDEUX L., REVERET F., VARENNE C., KACHA A., MAHJOUB A., PELISSIER B.
N2 plasma passivation of GaAs(100) surface and air exposure study of GaN/GaAs structures
Journées spectroscopies Electroniques, Janvier 2018, Strasbourg
2018


MEHDI H., MONIER G., ROBERT GOUMET C., BIDEUX L., HOGGAN P., REVERET F., VARENNE C., KACHA A., MAHJOUB A., PELISSIER B.
Passivation par voie plasma N2 de la surface de GaAs(100) et étude de l’oxydation de la structures GaN/GaAs
Journees Surfaces et Interfaces (JSI2018), Janvier 2018, Strasbourg
2018


MONIER G., BIDEUX L., ROBERT-GOUMET C., HOGGAN P., PAGET D., KUBSKY S., DUMAS P.
In situ ATR-FTIR investigations of early stages of GaAs (001) and (111)B surface nitridation
ECASIA'17 European Conference on Applications of Surface and Interface Analysis
2017


MEHDI H., ROBERT GOUMET C., MONIER G., BIDEUX L., GRUZZA B.
Combined XPS model and growth kinetic model of passivating GaN thin film elaborated on GaAs
Journées des Spectroscopies Electroniques JSE2017, Juin 2017, Paris
2017


HIJAZI H., ANDRE Y., MONIER G., LEROUX C., AVIT G., CASTELLUCI D., BIDEUX L., TRASSOUDAINE A., GIL E., ROBERT-GOUMET C.
Croissance catalysée de nanofils de GaAs sur substrat de Si(111)
GDR PULSE, Atelier consacré aux techniques de caractérisations structurales, Nice
2017


MAHJOUB M., MONIER G., ROBERT-GOUMET C., REVERET F., ECHABAANE M., CHAUDANSON D., PETIT M., BIDEUX L., GRUZZA B.
Synthesis and study of stable and size-controlled zno-sio2 quantum dots: application as a humidity sensor
journal of physical chemistry c, vol. 120, p. 11652--11662
2016 may


MONIER G., MAHJOUB A., ROBERT-GOUMET C., BIDEUX L., GRUZZA B.
Nouvelle méthode de détermination de la fonction de correction d’un analyseur d’électron : Application aux études quantitatives par spectroscopies d’électrons : méthode combinée XPS + MM-EPES
ELSPEC 2016 Conférence francophone sur les spectroscopies d'électrons
2016


MAHJOUB A., ROBERT GOUMET C., MONIER G., BIDEUX L., GRUZZA B.
Determination of gold quantity deposited on silicon substrates by elastic electron measurements associated with Monte Carlo simulations and XPS measurements
ECASIA'15, 16th European Conference on Applications of Surface and Interface Analysis, Grenada, 28 sept.-1 oct, Espagne
2016


ROBERT GOUMET C., MAHJOUB A., MONER G., BIDEUX L., GRUZZA B.
MM-EPES : Non destructive method for thin films analysis. Applications to Si nanoporous surfaces and Au deposits on SiO2/Si
ECASIA'15, 16th European Conference on Applications of Surface and Interface Analysis, Grenada, 28 sept.-1 oct, Espagne
2016


MAHJOUB A., MONIER G., ROBERT GOUMET C., BIDEUX L., GRUZZA B.
XPS and MM-EPES techniques combined for the study of ultra thin films: Application to gold deposition on SiO2/Si structures
JSPS International Workshop Core-to-Core Program Atomically Controlled Processing for Ultra-large Scale Integration Marseille - France, July 9-10, 2015 :
2016


KACHA A., AKKAL A., BENAMARA Z., AMRANI M., MONIER G., ROBERT-GOUMET C., BIDEUX L., GRUZZA B.
Effects of the GaN layers and the annealing on the electrical properties in the Schottky diodes based on nitrated GaAs
Superlattices and Microstructures, vol. 83, p. 827--833
2015


MAHJOUB M., MONIER G., ROBERT-GOUMET C., BIDEUX L., GRUZZA B.
XPS combined with MM-EPES technique for in situ study of ultra thin film deposition: Application to an Au/SiO2/Si structure
Applied Surface Science, vol. 357, p. 1268--1273
2015


MONIER G., PAULY N., ROBERT-GOUMET C., MAHJOUB A., BIDEUX L., GRUZZA B., TOUGAARD S.
Influence of surface core hole effects for quantitative X-ray photoelectron spectroscopy by peak shape analysis
ECASIA'15 European Conference on Applications of Surface and Interface Analysis
2015


PAULY N., DUBUS A., MONIER G., MAHJOUB M., BIDEUX L., GRUZZA B.
Energy dependence of the energy loss function parametrization of indium in the Drude-Lindhard model
Surface and Interface Analysis, vol. 46, p. 283--288
2014


PAULY N., DUBUS A., MONIER G., ROBERT-GOUMET C., MAHJOUB M., BIDEUX L., GRUZZA B.
Energy dependence of the energy loss function parametrization of indium in the drude-lindhard model
surface and interface analysis, vol. 46, p. 283--288
2014


MAHJOUB M., MONIER G., ROBERT-GOUMET C., BIDEUX L., GRUZZA B.
New method for the determination of the correction function of a hemisperical electron analyser based on elastic electron images
Journal of Electron Spectroscopy and Related Phenomena, vol. 197, p. 80--87
2014


GIL E., DUBROVSKII V., AVIT G., ANDRE Y., LEROUX C., LEKHAL K., GRECENKOV J., TRASSOUDAINE A., CASTELLUCI D., MONIER G., RAMDANI M., ROBERT C., BIDEUX L., HARMAND J., GLAS F.
Record Pure Zincblende Phase in GaAs Nanowires down to 5 nm in Radius
Nano Letters, vol. 14, p. 3938--3944
2014


ROBERT-GOUMET C., MAHJOUB M., MONIER G., BIDEUX L., CHELDA S., DUPUIS R., PETIT M., HOGGAN P., GRUZZA B.
Development of monte-carlo simulations for nano-patterning surfaces associated with mm-epes analysis: application to different si(111) nanoporous surfaces
surface science, vol. 618, p. 72--77
2013


PAGET D., BERKOVITS V., ULIN V., OZANAM F., DUMAS P., KUBSKY S., LAHLIL K., BIDEUX L., MONIER G.
Real time infrared absorption analysis of nitridation of gaas(001) by hydrazine solutions
journal of the electrochemical society, vol. 160, p. 229--236
2013


TALBI A., BENAMARA M., TALBI M., BENAMARA Z., AKKAL B., GRUZZA B., ROBERT-GOUMET C., BIDEUX L., MONIER G.
Study of inp(100)nitridation using aes spectroscopy and electrical analysis: effect of annealing after nitridation
journal of optoelectronics and advanced materials, vol. 15, p. 509--513
2013


MONIER G., BIDEUX L., ROBERT-GOUMET C., GRUZZA B., ANDRE Y., AVIT J., PETIT M., MENYHARD M., PAGET D., KUBSKY S.
High quality c-GaN ultra-thin film growth on GaAs (001): Passivating effect and initiation of cubic-GaN bulk structure growth
ECASIA'13 European Conference on Applications of Surface and Interface Analysis
2013


PETIT M., DAU M., MONIER G., MICHEZ L., BARRE X., SPIESSER A., THANH V., GLACHANT A., COUDREAU C., BIDEUX L., ROBERT-GOUMET C.
Carbon diffusion and reactivity in mn <inf>5</inf>ge <inf>3</inf> thin films
physica status solidi (c) current topics in solid state physics, vol. 9, p. 1374--1377
2012


VARENNE C., NDIAYE A., BRUNET J., MONIER G., SPINELLE L., PAULY A., BIDEUX L., LAURON B., ROBERT-GOUMET C.
Comparison of inp schottky diodes based on au or pd sensing electrodes for no <inf>2</inf> and o <inf>3</inf> sensing
solid-state electronics, vol. 72, p. 29--37
2012


MONIER G., BIDEUX L., ROBERT-GOUMET C., GRUZZA B., PETIT M., LABAR J., MENYHARD M.
Passivation of gaas(001) surface by the growth of high quality c-gan ultra-thin film using low power glow discharge nitrogen plasma source
surface science, vol. 606, p. 1093--1099
2012


AMEUR K., MAZARI H., TIZI S., KHELIFI R., BENAMARA Z., BENSEDDIK N., CHAIB A., ZOUGAGH N., MOSTEFAOUI M., BIDEUX L., MONIER G., GRUZZA B., ROBERT-GOUMET C.
Study of the characteristics current-voltage and capacity-voltage of hg/gan/gaas structures
sensor letters, vol. 9, p. 2268--2271
2011


MONIER G., BIDEUX L., ROBERT-GOUMET C., GRUZZA B.
Study of high quality GaN epilayers formation on GaAs(001) using low power GDS nitrogen plasma source
ICFSI 13 International Conference on the formation of semiconductor Interfaces
2011


RAMDANI M., GIL E., LEROUX C., ANDRE Y., TRASSOUDAINE A., CASTELLUCI D., BIDEUX L., MONIER G., ROBERT-GOUMET C., KUPKA R.
Fast growth synthesis of gaas nanowires with exceptional length
nano letters, vol. 10, p. 1836--1841
2010


MANCEAU M., GAUME J., RIVATON A., GARDETTE J., MONIER G., BIDEUX L.
Further insights into the photodegradation of poly(3-hexylthiophene) by means of x-ray photoelectron spectroscopy
thin solid films, vol. 518, p. 7113--7118
2010


GRUZZA B., CHELDA S., ROBERT-GOUMET C., BIDEUX L., MONIER G.
Monte carlo simulation for multi-mode elastic peak electron spectroscopy of crystalline materials: effects of surface structure and excitation
surface science, vol. 604, p. 217--226
2010


FLORI M., GRUZZA B., BIDEUX L., MONIER G., ROBERT-GOUMET C., KRAWCZYK M.
Surface analysis of a plasma-nitrided structural steel
metalurgia international, vol. 15, p. 5--9
2010


BENAMARA Z., MECIRDI N., AKKAL B., MAZARI H., CHELLALI M., TALBI A., GRUZZA B., BEN KHALIFA S., ROBERT-GOUMET C., MONIER G., BIDEUX L.
Electrical characterization and electronic transport modelization in the inn/lnp structures
sensor letters, vol. 7, p. 712--715
2009


FLORI M., GRUZZA B., BIDEUX L., MONIER G., ROBERT-GOUMET C., BENAMARA Z.
First stages of surface steel nitriding: x-ray photoelectron spectroscopy and electrical measurements
applied surface science, vol. 255, p. 9206--9210
2009


DESPLATS O., GALLO P., DOUCET J., MONIER G., BIDEUX L., JALABERT L., ARNOULT A., LACOSTE G., ARMAND C., VOILLOT F., FONTAINE C.
On the use of a O2:SF6 plasma treatment on GaAs processed surfaces for molecular beam epitaxial regrowth
applied surface science, vol. 255, p. 3897--3901
2009


ROBERT-GOUMET C., MONIER G., ZEFACK B., CHELDA S., BIDEUX L., GRUZZA B., AWITOR O.
Sem and xps studies of nanohole arrays on inp(1 0 0) surfaces created by coupling aao templates and low energy ar+ ion sputtering
surface science, vol. 603, p. 2923--2927
2009


MONIER G., BIDEUX L., DESPLATS O., FONTAINE C., ROBERT-GOUMET C., GRUZZA B.
Xps study of the o <inf>2</inf> /sf <inf>6</inf> microwave plasma oxidation of (0 0 1) gaas surfaces
applied surface science, vol. 256, p. 56--60
2009


MONIER G., BIDEUX L., DESPLATS O., FONTAINE C., ROBERT-GOUMET C., GRUZZA B.
XPS study of the O2/SF6 micro-wave plasma oxidation of (001)GaAs surfaces
ECOSS 26 26th European Conference on Surface Science
2009


FLORI M., GRUZZA B., BIDEUX L., MONIER G., ROBERT-GOUMET C.
A study of the 42crmo4 steel surface by quantitative xps electron spectroscopy
applied surface science, vol. 254, p. 4738--4743
2008


CHELDA S., ROBERT-GOUMET C., GRUZZA B., BIDEUX L., MONIER G.
Effect of surface roughness on epes and arepes measurements: flat and crenels silicon surfaces
surface science, vol. 602, p. 2114--2120
2008


BIDEUX L., MONIER G., MATOLIN V., ROBERT-GOUMET C., GRUZZA B.
Xps study of the formation of ultrathin gan film on gaas(1 0 0)
applied surface science, vol. 254, p. 4150--4153
2008


FLORI M., GRUZZA B., BIDEUX L., MONIER G., ROBERT-GOUMET C., CHERRE J., DE BAYNAST H.
Xps, epma and microstructural analysis of a defective industrial plasma-nitrided steel
surface and coatings technology, vol. 202, p. 5887--5894
2008


ROBERT-GOUMET C., PETIT M., BIDEUX L., GRUZZA B., MONIER G., MATOLIN V., SKALA T., TSUD N., PRINCE K.
Combined eels, leed and sr-xps study of ultra-thin crystalline layers of indium nitride on inp(1 0 0)-effect of annealing at 450 °c
applied surface science, vol. 253, p. 4445--4449
2007


BEN KHALIFA S., GRUZZA B., ROBERT-GOUMET C., BIDEUX L., MONIER G., SAIDI F., M'GHAIETH R., HJIRI M., HAMILA R., HASSEN F., MAAREF H., BREMOND G., BEJI L.
Study of porous iii-v semiconductors by electron spectroscopies (aes and xps) and optical spectroscopy (pl): effect of ionic bombardment and nitridation process
surface science, vol. 601, p. 4531--4535
2007


BIDEUX L., ROBERT C., MERLE S., GRUZZA B., GOUMET E., GIL E.
Some applications of elastic peak electron spectroscopy for semiconductor surface studies
surface and interface analysis, vol. 26, p. 903--907
1998